National Instruments is hosting the fourth annual Automated Test Summit, featuring technical sessions focused on identifying trends and overcoming new challenges in automated test. The Automated Test Summit 2007 will be hosted live on the Internet on 8 May and will be available on demand for 90 days. At the free full-day event, attendees can view keynote presentations, watch technical sessions, participate in live Q&A forums and interact with vendors in the exhibitor area.
Kevin Bisking, NI Automated Test Product Manager, comments: "National Instruments works with technology leaders and ATE suppliers every year to host the Automated Test Summit, which presents the latest test strategies and technologies addressing challenges faced by test engineers and senior managers from leading electronics manufacturers. To make the summit more accessible to engineers facing increased workloads, NI is hosting the event online this year. Engineers will be able to learn the best practices in test development at their convenience."
Representatives from companies such as Microsoft, Intel, Tektronix, Averna and BAE Systems will share their technical expertise and best practices during the event. NI Business and Technology Fellow Mike Santori will present the keynote 'Developing Next-Generation Test Systems'. Marvin Landrum, automation infrastructure manager at Texas Instruments, will present the afternoon keynote 'Strategies for Developing a Global Test Program'.
Technical tracks feature the following topics:
- Reducing cost by migrating to a common test system architecture
- Improving system performance with next-generation technologies
- Strategies for developing a global test program
- Best practices for incorporating new measurements into a test system
Participants can register online and find a full list of technical sessions at www.ni.com/testsummit/. Alternatively, use the form on this page to request a callback or more information.