National Instruments is hosting what it describes as the first online Pan-European Automated Test Summit, which will feature technical sessions on identifying trends and overcoming new challenges in automated test. The Pan-European Automated Test Summit is a free, full-day event hosted live on the Internet on 27 November 2007 at 09:00 GMT. During the summit, attendees can view keynote presentations, watch technical sessions, participate in live Q&A forums and interact with vendors in the exhibitor area. This event will be available on demand for 30 days after the live event.
Francis Griffiths, NI Vice President of Sales in Europe, comments: "National Instruments is excited to be working with technology leaders and ATE to present the latest test strategies and technologies addressing challenges faced by test engineers and senior managers from leading electronics manufacturers. To make the summit more accessible to engineers facing increased workloads, NI is hosting the event online so engineers can learn the best practices in test development at their convenience."
Representatives from companies such as Averna, Flextronics Sweden, Intel, Microsoft, National Instruments and Texas Instruments will share their technical expertise and best practices during the event. Additionally, NI Business and Technology Fellow Mike Santori will open the event with the keynote Developing Next-Generation Test Systems, and Marvin Landrum, Automation Infrastructure Manager at Texas Instruments, will present the afternoon keynote Strategies for Developing a Global Test Program. Technical tracks feature the following topics:
- Cost-effective strategies for test system design
- Design insights for creating reusable test systems
- Techniques for maintaining system accuracy and availability
- Tips for integrating disparate instrumentation platforms
Find out more about the latest NI Test Summit at uk.ni.com/testsummit or use the form on this page.