National Instruments is announcing the fifth annual Automated Test Summit, an online event featuring technical sessions focused on identifying trends and overcoming challenges in automated test. The Automated Test Summit 2008 will be hosted live on the Internet on 5 June 2008 and will be presented in the Americas, Europe and Asia, giving attendees the opportunity to speak with experts in various languages. At the free full-day event, attendees can view keynote presentations, watch technical sessions, participate in live questions-and-answer forums and interact with vendors in the exhibition area.
Jean-Yves Allard, Vice President of Research and Development for Averna, says: “The NI Automated Test Summit brings together a real-time global audience that covers every conceivable industry associated with electronics test. As an exhibitor, we interact live with booth visitors from four continents at the same time. The balance of technical presentations, coupled with the latest offerings from the exhibitors, provides a valuable forum for all participants – and they do not even have to leave their desks.”
Representatives from leading test and measurement companies world wide such as Averna, Cal-Bay, Intel, Microsoft and Tektronix will share their technical expertise and best practices in sessions during the event. NI Business and Technology Fellow Mike Santori will present the keynote: Optimising Efficiency in Test. Session themes include:
- Reducing software development cost
- Latest trends in hardware design
- Extending the life of your test system
- Test engineering panel discussion
To register online and to view a full list of the technical sessions, visit www.ni.com/testsummit. Alternatively, use the form on this page to request a callback or more information.