Sick to reveal new sensors at Total Processing and Packaging

18 March 2010

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Sick to reveal new sensors at Total Processing and PackagingSick (UK) will showcase the latest additions to its innovative range of sensors on stand 5521 at the Total Processing and Packaging Show. In particular, the company will launch new RFID, flow and barcode sensors, highlighting Sick's continued investment in R&D and its dedication to expanding its wide range of sensing systems.

Darren Pratt, the UK instrumentation product specialist at Sick, comments: "As a market leader in the sensing industry we are dedicated to developing our product range, ensuring that we are able to meet the diverse needs of our growing customer base. Total Processing and Packaging attracts a wide audience with varied needs, making it the ideal platform to launch the latest additions to our portfolio."

First flow sensor

The Total show will see Sick expand its industrial instrumentation offering into the flow sensor market for the first time, with the launch of the FFU in-line flow measurement sensor. The FFU uses ultrasonic flow measurement principles to deliver high-accuracy flow and volume measurement for conductive or non-conductive fluids.

Sick will also unveil the UP56 level sensor, an ultrasonic non-contact level sensor that is designed for use in pressurised and non-pressurised vessels. With an operating range of up to 5m, it is suitable for sensing aggressive fluids, heavily contaminated fluids and abrasive bulk materials.

In addition, Sick will launch its CLV6 series of barcode scanners, which are designed for product security applications. The CLV6 series delivers high read rates at fast speeds. The configurable host string means network traffic is reduced to a minimum, enabling multiple scanners to be installed on an Ethernet IP network so data can be read into a PLC.

Visitors to the show will also be able to preview the latest addition to Sick's RFID range, namely the RFH620 for intralogistics. The company will also showcase its new ICR845 code reader for long-range applications.

Visit Sick at the Total Processing and Packaging show at the NEC from 25–27 May 2010.

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