Registration is now open for the Automated Test Summit 2015, hosted by National Instruments on Thursday 2 July at the Royal Berkshire Conference Centre, Madejski Stadium, Reading, UK. This free-to-attend industry technical conference allows engineers and test managers to learn more about the top trends and technologies influencing automated test. The event brings together NI and industry experts for technology discussions and best practice sharing, case studies, hands-on training and networking opportunities.
With a choice of technical content, attendees can tailor the day to match their own interests, focusing on building automated test systems, RF & communications, hands-on training, or a track dedicated to test challenges for the aerospace & defence industries. A wide variety of technical presentations from NI experts, partners and customers will cover topics from building flexible test systems, managing obsolescence, to tips and tricks for TestStand development. In addition, LabVIEW and TestStand Certification exams and preparation classes are free to sit during the summit.
The Keynote address will be given by Tony Robson, Senior Product & Business Manager for PXI at NI Global Preferred Partner for Cellular & Connectivity Applications, Cobham Wireless, and will address the most pressing challenges engineers are currently facing in test system development for wireless & cellular applications, and how PXI can help address these. In addition, NI’s Abhay Samant, Section Manager for RF Product Marketing, will also talk about trends in automated test and PXI, as well as providing insight into the key challenges test engineers in the aerospace & defence industries face.
Attendees will have the opportunity to explore recently released products based on PXI Gen 3 technology. NI has collaborated with Intel to deliver the industry’s first PXI Express embedded controller powered by an Intel Xeon 8-core processor. Combined with the industry’s first all-hybrid PXI chassis with PCI Express Gen 3 technology, this delivers up to twice the processing power and system bandwidth compared to the previous highest-performance PXI systems.
For more details, including the full Automated Test Summit 2015 agenda and how to register, visit uk.ni.com/testsummit.