National Instruments is expanding of its line of PXI SMUs for automated semiconductor test. Suitable for parallel testing of multipin semiconductor DUTs, the new NI PXIe-4143 SMU offers 600,000 samples per second and four channels – claimed to be the highest channel density of any SMU – and expands NI’s multichannel SMU output range to 24V at 150mA. Such features help reduce the cost of capital equipment, decrease test times and increase mixed-signal flexibility for a variety of DUTs.
Ron Wolfe, Vice President of Semiconductor Test at National Instruments, says: “With the new NI PXIe-4143, our SMU family now gives test engineers DC measurement options for almost any device. Our industry-leading channel counts, superior sample rates and SourceAdapt technology for custom tuning, provide one of the most flexible selections of semiconductor measurement instruments available.”
- Four SMU channels with up to 600 kS/s sampling rate to measure fast transient responses
- Four-quadrant output capability of 24V at 150mA, complementing pre-existing NI SMU capabilities for sourcing and sinking
- Measurement sensitivity of 10pA
- Flexible, compact PXI modular instrumentation architecture for small-footprint equipment deployments
Readers can learn more about the NI PXIe-4143 and other SMUs with the following additional resources: