Heidenhain provides student scholarships in metrology

The aim of the LAMDAMAP conference series is to present the latest technology for assessing the performance of machine tools and measuring machines. It also seeks to promote collaboration between researchers, designers, machine builders and end users. Research and developments that improve machine performance along with calibration, certification and standardisation are presented during the proceedings.

Neil Prescott, managing director of Heidenhain (GB) comments: "Advanced machine tool metrology allows the performance of machines to be assessed and underpins the production of more accurate components. As the trend towards nanometric surface finishes and features advances, matching form and finish consistently when producing complex parts remains a major challenge.

"LAMDAMAP is a prime source of relevant knowledge. It allows the next generation of manufacturers to use all available advances in measurement techniques to meet tomorrow's production challenges. That is why Heidenhain is keen to support the conferences and scholarships."

This year, there was a presentation by the company on the first day of the event. Dr Tim Boye from the German headquarters delivered a paper entitled "Increasing 5-axis accuracy by using a cross-grid encoder for volumetric compensation'. In the afternoon of the second day, six Heidenhain (GB) Scholarship Awards were presented in the exhibition area.

Half went to researchers at the host venue, the University of Huddersfield, UK: Mr Akshay Potdar, Mr Ali Mohamed Abdulshahed and Mr Moschos Papananias. The remainder were awarded to Mr Jonathan Abir, Cranfield University UK; Mr Fabien Viprey, Laboratoire National de M©trologie et d'Essais, France; and Mr Wiktor Harmatys, Cracow University of Technology, Poland.

To learn more about student scholarships supported by Heidenhain please visit www.heidenhaingb.com.